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E1
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Group Westphal
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Research
Publications
de Siervo, R. Landers, G.G. Kleiman and C. Westphal Materials Science in Semiconductor Processing 9 , 1049 (2006) Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system [...] A. Pancotti, R. Landers, G.G. Kleiman and C. Westphal Materials Science in Semiconductor Processing 9 , 1055 (2006) Structure of the interface between ultrathin SiO2 films and 4H-SiC(0001) M. Schürmann [...] in Nordrhein-Westfalen M. Tolan, T. Weis, C. Westphal, K. Wille Synchrotron Radiation News 16 (2), 9 (2003) Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2×1-reconstructed …